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Environmental Test Reports

 

QUALIFICATION TEST REPORT
ON
ONE (1) POWER SUPPLY, PART NUMBER AB20S
ONE (1) POWER SUPPLY, PART NUMBER AB35S
AND
ONE (1) POWER SUPPLY, PART NUMBER AB50S

TEST REPORT NO. TR68311

DECEMBER 19, 1989

 

Written by: Debra H. Osterberg, Technical Writer Date: 12/19/89
Approved by: T.A. Nowakowski, Program Manager Date: 12/19/89
Approved by: A.S. Brockamp, Quality Assurance Manager Date: 12/19/89
1.0 PURPOSE
The purpose of this test report is to present the procedures used and the results obtained during the testing of Power Supplies, part number AB20S, s/n 333576, part number AB35S, s/n 333581, and part number AB50S, s/n 333586.  Testing was conducted in accordance with 2.1 and 2.2 below.
2.0 REFERENCES
2.1 Martek Power Abbott Electronics Purchase Order Number 74435
2.2 MIL-STD-810C
3.0 MANUFACTURER
MARTEK POWER ABBOTT ELECTRONICS
2727 S. La Cienega Boulevard
Los Angeles, CA  90016
4.0 SUMMARY
ThePower Supplies, herein after referred to as the "specimens", were subjected to the tests of 6.0 herein, in accordance with 2.1 thru 2.3 above, as follows:

TEST MATRIX
TEST TITLE

SERIAL
NUMBERS

REPORT
PARAGRAPH
TEMPERATURE/ALTITUDE ---ALL--- 6.1
VIBRATION/SINUSOIDAL CYCLING ---ALL--- 6.2
SHOCK ---ALL--- 6.3
ACCELERATION ---ALL--- 6.4
HIGH IMPACT SHOCK ---ALL--- Appendix B
Part number AB50S was removed from the High Impact Shock test after blow number six (5 foot drop in top axis) due to damaged mounting threads.  All four (4) mounting threads were found to be damage on part number AB20S after blow number 9 (5 foot drop in side axis).  See High Impact Shock test report herein in Appendix B.
This program is described in detail in section 6.0, herein.
This test report represents Independent Testing Laboratories, Inc. findings and conclusions based upon the conduct of the test and procedures described herein with respect only to the particular product(s) or component(s) which were provided to Independent Testing Laboratories, Inc. by the customer for testing and evaluation proposed per written purchase orders, procedures or verbal instructions.  All findings and conclusions set forth herein are expressly limited by and are subject to the conditions, exceptions, qualifications, parameters, and limitations described and noted herein.  Independent Testing Laboratories, Inc. hereby expressly disclaims any responsibility of any nature or type whatsoever with respect to the applicability of the results set forth hereing to products or components other than the particular product(s) or component(s) which were actually physically tested by Independent Testing Laboratories, Inc. for purposes of this test report.  This report is furnished for the sole and exclusive use of the customer and may not be used by or relied upon by any other party in the absence of the express written consent of Independent Testing Laboratories, Inc.
6.0 REQUIREMENTS, PROCEDURES AND RESULTS
6.1 TEMPERATURE ALTITUDE
6.1.1 PERFORMANCE CRITERIA
There shall be no visible evidence of damage or deterioration noted as a result of this test.
6.1.2 TEST PROCEDURE
The test specimens were subjected to the temperature altitude testing described in Method 504.1, Procedure 1, Category 6 of Reference 2.2, herein.
Functional testing was performed by Martek Power Abbott personnel during various phases of the test.  Test data was recorded on the appropriate data sheets.  All functional testing was performed by Martek Power Abbott Transistor Labs, Inc. personnel.
The temperature extremes were +71°C and -55°.
The altitude extreme was 70,000 feet.
6.1.3 TEST RESULTS
The specimens met the requirements of paragraph 6.1.1 above.
Data for this test are presented herein in Appendix A.
Photographs for this test are presented herein in Appendix C.
6.2 VIBRATION, SINUSOIDAL CYCLING
6.2.1 PERFORMANCE CRITERIA
There shall be no visible evidence of damage or deterioration noted as a result of this test.
6.2.2 TEST PROCEDURE
The specimen was mounted to the vibration exciter by its normal mounting means and the control accerlerometer was placed on the fixture.
The input was applied along each of the three (3) mutually perpendicular axes at a sweep rate of 5 Hz to 2000 Hz in Twenty (20) minutes, with a time duration per axis of three (3) hours, nine (9) hours total.  The input excitation was as follows:
LEVEL (G'S) FREQUENCY (HZ)
0.10" D.A. 5 to 14 Hz
± 1.0 G 14 to 23 Hz
0.036" D.A. 23 to 90 Hz
± 15 G 90 to 2000 Hz
The specimens were operating and continuously recorded on a strip chart recorder during this test.
All functional testing was performed by Martek Power Abbott Transistor Labs personnel.  All data for functional testing was retained by Martek Power Abbott Transistor Labs.
6.2.3 TEST RESULTS
The specimens met the requirements of paragraph 6.2.1 above.
Data for this test are presented in Appendix A.
6.3 SHOCK TEST
6.3.1 PERFORMANCE CRITERIA
There shall be no visible evidence of damage or deterioration noted as a result of this test.
 
6.3.2 TEST PROCEDURE
The specimens were subjected to a Half-Sine Shock Pulse per Method 516.2, Procedure I, amplitude 40 G's and duration of 11 milliseconds (Half-Sine Shock Pulse configuration).  Six (6) shocks per axis, three (3) in each direction, were applied along three mutually perpendicular axes of the specimens for a total of 18 shocks.
The specimens were non-operating during this test.
Allfunctional testing was performed by Martek Power Abbott Transistor Labs personnel.  All data for functional testing was retained by Martek Power Abbott Transistor Labs.
6.3.3 TEST RESULTS
The specimens met the requirements of paragraph 6.3.1 above.
Data for this test are presented in Appendix A.
MIL-STD-810E, Method 513.4, Proc. 3
6.4 ACCELERATION
6.4.1 PERFORMANCE CRITERIA
There shall be no visible evidence of damage or deteriortation noted as a result of this test.
6.4.2 TEST PROCEDURE
The specimens were installed into the test fixture and attached to the centrifuge.
The input axes were X, Y, and Z in each direction.  The radius was 22.5 inches.  The acceleration level was 14 G's.  Test duration was one (1) minute per direction.  The R.P.M. for 14 G's was 150.
The specimens were non-operating during the test.
All functional testing was performed by Martek Power Abbott Transistor Labs personnel.  All data for functional testing was retained by Martek Power Abbott Transistor Labs.
6.4.3 TEST RESULTS
The specimens met the requirements of paragraph 6.4.1 above.
Data for this test are presented in Appendix A.


 

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