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Electromagnetic Compatibility Test Reports
REPORT OF
ELECTROMAGNETIC INTERFERENCE
AND SUSCEPTIBILITY TESTS
ON POWER SUPPLIES
P/N'S NB50SM, NB15OTM AND SM200S
Prepared by:
NATIONAL TECHNICAL SYSTEMS (NTS)
EMI/EMC TEST GROUP
1536 EAST VALENCIA DRIVE
FULLERTON, CALIFORNIA 92831
JULY 1997
| 1.0 |
SCOPE |
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Five (5) Martek Power
Abbott Inc. Power Supplies were tested from 30 April through 19 June 1997, in accordance
with the tests and requirements of MIL-STD-461D, and NTS Test Procedure No. 771-3616,
which shall be referred to as the subject specification for the remainder of this test
report.
The power supplies were four (4) 28 VDC: P/N NB50SM, S/N 7800348; P/N NB150TM, S/N 399258;
P/N NB150TM, S/N 401206; and P/N SM200S, S/N 1201524; and one (1) power supply was 270
VDC: P/N SM200S, S/N 1203272.
The applicable test requirements of the subject specification are presented here for
convenience.
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| TEST
REQUIREMENTS |
| TEST METHOD |
FREQUENCY RANGE |
TEST POINTS |
| Interference: |
| Conducted, CE101 |
30 Hz-10 kHz |
Power Lead Lines |
| Conducted, CE102 |
10 kHz-10 MHz |
Power Lead Lines |
| Radiated, RE101 H-Field |
30 Hz-10 kHz |
Case & Cables |
| Radiated, RE102 E-Field |
10 KHz-18 GHz |
Power Lead Lines |
| Susceptibility: |
| Conducted, CS101 |
30 Hz-50 kHz |
Power Lead Lines |
| Conducted, CS114 |
10 kHz-400 MHz |
Bulk Cable Injection |
| Conducted, CS115 |
250 V, 30 nsec Pulse Width |
Power, Interconnect Cables |
| Conducted, CS116 |
10 kHz-100 kHz |
Power, Interconnect Cables |
| Conducted, RS101 |
30 Hz-100 kHz |
Case & Cables |
| Conducted, RS103 |
10 kHz-10 GHz |
20 V/m, Case & Cables |
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| 2.0 |
TEST RESULTS |
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The test results are
tabulated in the test summary and the referenced test data and graphs are presented in
Appendix A.
28 VDC Power Supplies
P/N NB50SM, S/N 7800348 - Subjected to CE101, CE102, RE101, RE102, CS101, CS114, CS115,
CS116, RS101 and RS103. The test item exceeded the RE102 requirements (see NOD #1).
P/N NB150TM, S/N 399258 - Subjected to CE101, CE102, RE101, RE102, CS101, and RS101.
However, because this part was returned to Martek Power Abbott Electronics, it was not
subjected to CS114, CS115, CS116 or RS103. The test item exceeded the RE102 requirements
(see NOD #2).
P/N NB150TM, S/N 401206 - This is the replacement part for P/N NB150TM, S/N 399258, and
was subjected to CS114, CS115, CS116 and RS103.
P/N SM200S, S/N 1201524 - Subjected to CE101, C3102, RE101, RE102, CS201, RS101, CS114,
CS115, CS116, and RS103. The test item exceeded the RE101 (see NOD #5) and RE102
requirements (see NOD #3).
270 VDC Power Supply
P/N SM200S, S/N 1203272 - Subjected to CE101, C3102, RE101, RE102, CS201, RS101, CS114,
CS115, CS116 and RS103. The test item exceeded the RE101 (see NOD #6) and RE102
requirements (see NOD #4). |
| 3.0 |
GENERAL INFORMATION OF TESTING |
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| 3.1 |
Security Classification |
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The test
samples were Unclassified
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| 3.2 |
Test Facility |
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One of NTS' 20' x 20' x
10' double-solid shielded enclosures was used for testing covered by this report. The
enclosures are used for testing covered by this report. The enclosures are manufactured of
zinc plated 20 gauge cold-rolled steel panels. The ambient level is at least 6 dB below
the specification limit. |
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| 3.3 |
Ground Plane |
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The ground plane used for
the tests covered by this report was a 3' x 20' x 0.065" copper sheet (the top of the
bench) bonded to the shielded enclosure in accordance with the specification requirements. |
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| 3.4 |
Test Equipment |
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The test instruments used
during testing covered by this report are presented in the equipment list in Appendix B. |
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| 3.4.1 |
Instrumentation Calibration Policy |
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National Technical Systems
adheres to a standard calibration cycle. Each category "A" instrument undergoes
recalibration every 6 months, while other instruments are recalibrated on a periodic
basis. All calibration is traceable to the National Institute of Standards and Technology
(NIST).
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| 3.5 |
Test Setup |
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The test setups required for the
various tests conformed to the test provisions stated in the subject specification.
Typical test setup photographs showing the test sample and associated equipment used are
included in Appendix B. |
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| 3.6 |
Emissions Setup for HP Automated System |
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The values included in the
emission setup are actual values of particular transducers used at the time of testing,
and actual value of the pre-amplifier gain. This is included in Appendix B. |
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